Thin Film Measurement Profilm

Thin film measurement - Filmetrics Profilm3D

Manufacture: Filmetrics Profilm3D

Capabilities

  • Thickness Range, WLI 50nm - 10mm
  • Sample Reflectance Range 0.05% - 100%
  • Camera 2592 x 1944 (5 megapixels)
  • State-of-the-art white light interferometry (WLI) optical profiler to measure surface profiles and roughness down to 0.05 µm
  • Thickness range: 50 nm–10 mm
  • Sample reflectance range: 0.05%–100%
  • 10x Nikon Mirau interferometric objective lens
    • Field-of-view: 2.0 × 1.7 mm
    • Spatial sampling: 0.88 µm
  • Autofocus
  • 100 mm × 100 mm auto stage

BRIC

Baylor Research and Innovation Collaborative

100 Research Pkwy
Waco, TX 76704

(254) 710-6778

(254) 710-4665