Thin Film Measurement Filmetrics

Thin film measurement - Filmetrics F20-UV

Manufacture: Filmetrics F20-UV

Capabilities

  • VIS (190–1100 nm) version
  • Thickness range: 1 nm – 40 µm
  • SS-3 sample stage with fiber optic cable
  • Flattening filter (for highly-reflective substrates)
  • Thin-Film Measurement System using spectral reflectance detection method
  • VIS (190–1100 nm) version
  • Thickness range: 1 nm – 40 µm
  • SS-3 sample stage with fiber optic cable 
  • Integrated spectrometer/light source unit
  • Flattening filter (for highly-reflective substrates)

BRIC

Baylor Research and Innovation Collaborative

100 Research Pkwy
Waco, TX 76704

(254) 710-6778

(254) 710-4665