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DTSTAMP:20260609T093320Z
SUMMARY:2012 Fall Graduate Colloquium Series:  Indra-Mani Ghimire/Cameron Kopas
DESCRIPTION;ENCODING=QUOTED-PRINTABLE:Indra-Mani Ghimire=0D=0A=
The Effect on Cancerous Behaviour of a Cell Due to Changes in its Mechanical Properties=0D=0A=
If the allowance of mutated cells is increased, then they grow at a much faster rate compared to healthy surrounding cells. This research by Parag Katira et al. (Phys. Rev. Lett. 108, 028103 (2012)) shows how the change in intercellular bonding affects tumor malignancy and how these changes in the physical properties of cancer cells are mechanically responsible for uncontrolled division and migration of cancer=0D=0A=
cells.=0D=0A=
Cameron Kopas=0D=0A=
Analysis of TC Variation in Mo-Cu Bilayer Films for Transition Edge Detectors=0D=0A=
A series of Molybdenum&#8208;Copper bilayers for Transition Edge Bolometers are grown and characterized to develop a reliable process to produce bilayers with a depressed superconducting transition temperature (TC) near 120 mK. These bilayers have a fixed normal metal thickness at &#56257;&#57168;&#56258;&#57276;&#56258;&#57320; &#56259;&#56654; 1250 Å and a varying superconductor thickness 650 Å &#56259;&#56657; &#56257;&#57168;&#56258;&#57286;&#56258;&#57314; &#56259;&#56657; 1000 Å. Material characterization techniques such as X&#8208;Ray=0D=0A=
Diffraction (XRD), Rutherford Backscattering Spectroscopy (RBS), and Atomic Force Microscopy (AFM), in addition to low temperature electrical characterization techniques, are utilized to describe the films, and results are compared with a computer simulation of the Usadel proximity theory for the Mo&#8208;Cu system.  It is discovered that some Ar&#8208;contamination is present in certain bilayers, affecting film roughness, and=0D=0A=
is determined to be the cause of deviation in bilayer TC from the theoretical simulations.=0D=0A=
For more information contact: Dr.Linda Olafsen=0D=0A=
254-710-2541
LOCATION:Baylor Sciences Building, Room E.125
DTSTART;TZID=US_Central:20121012T153500
DTEND;TZID=US_Central:20121012T170000
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